Microelectronics

Download e-book for iPad: Anglo–American Microelectronics Data 1968–69. Manufacturers by G. W. A. Dummer, J. Mackenzie Robertson

Posted On March 30, 2017 at 9:02 am by / Comments Off on Download e-book for iPad: Anglo–American Microelectronics Data 1968–69. Manufacturers by G. W. A. Dummer, J. Mackenzie Robertson

By G. W. A. Dummer, J. Mackenzie Robertson

Anglo-American Microelectronics information 1968-69, quantity : brands R-Z offers info at the good points of the layout, building and alertness of microelectronic units. The ebook discusses the beneficial properties of the layout, building and alertness of radiation built-in circuits; Raytheon built-in circuits; RCA built-in circuits; and Signetics built-in circuits. The textual content additionally describes the beneficial properties of the layout, building and alertness of Siliconix built-in circuits; Sperry built-in circuits; Sprague built-in circuits; and STC thick movie circuits. The beneficial properties of the layout, development and alertness of Stewart-Warner micro circuits; Sylvania built-in circuits; Texas tools semiconductor networks; and transitron built-in circuits also are encompassed. The publication additional tackles the positive factors of the layout, development and alertness of Varo hybrid movie built-in circuits; Welwyn thick movie and skinny movie resistor networks; Westinghouse built-in circuits; and Zeltex hybrid built-in circuits. Designers, purchasers, and clients of microelectronic units will locate the publication priceless.

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Extra resources for Anglo–American Microelectronics Data 1968–69. Manufacturers R–Z

Sample text

1 1000 hrs End Points Same as in subgroup B6 TABLE IV - GROUP C, DESIGN TESTS SUBGROUP 1 C1 TEST LTPD CONDITIONS M A X . ACCEPTANCE NO. DC parameters Notes 1. 3 10 2 C2 NOTES: 1. All test equipment calibrated to meet requirements of MIL-Q-9858 and MIL-C 45662. 1 2. Details of tests, conditions and limits are given in the STATIC ELECTRICAL CHARACTERISTICS Table. 3. Details of tests, conditions and limits are given in the table SWITCHING (DYNAMIC) CHARACTERISTICS. 1577 Continued RADIATION RD-208 (Contd) RADIATION INTEGRATED CIRCUIT RELIABILITY PROGRAM The Radiation Integrated Circuit Reliability Program consists 1 0 0 % environmental screening and statistical of sampling tests designed to assure performance as specified herein, and provides for continuing uniformity bility in Radiation extra cost products.

1591 c Continued RADIATION RD-220 (Contd) RADIATION INTEGRATED CIRCUIT RELIABILITY PROGRAM The Radiation Integrated Circuit Reliability Program consists of 1 0 0 % environmental screening and statistical sampling tests designed to assure performance as specified herein, and provides for continuing uniformity and long-term reliability in Radiation products. These tests are made at no extra cost to the user and are performed in addition to other quality control inspections and tests which are performed prior to final hermetic seal.

ACCEPTANCE NO. A1 Visual and mechanical inspection Per MIL-STD-750. Method 2071 10 4 A2 A3 + 25°C DC parameters Note 2 10 4 + 25°C DC parameters Note 2 10 4 A4 + 125°C DC parameters A5 A6 - 5 5 ° C DC parameters -I- 25°C AC parameters Note 2 Note 2 Note 3 15 15 10 4 4 4 ~1 1 TABLE III - GROUP B ENVIRONMENTAL TESTS TEST SUBGROUP SPECIFIC CONDITIONS LIMITS MIL-STD-750 METHOD SYMBOL I B1 1 B2 Physical Dimensions See TO-84 Outline MIN. LTPD MAX. UNIT 2066 MAX. ACCEPT NO. 1 End Points (Failure Criteria) "0" "0" "1" "1" 1 B3 Output Voltage Input Current Input Current Output Current Note Note Note Note 1, subgroup A3 1, subgroup A3 1, subgroup A3 1, subgroup A3 "1" Shock 1500G.

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